High-resolution linear actuator; 2-phase stepper motor with gearhead; 26 mm travel range; 125 N feed force; 0.8 mm/s maximum velocity; ball screw; limit switches; 0.15 m cable length; vacuum-compatible to 10-6 hPa
L-220 V6 High-Resolution Linear Actuator Suitable for Vacuum
Suitable for High Cycle Numbers
- Suitable for vacuum up to 10-6 hPa
- Forces to 125 N
- 26 mm (1") travel range
- Stepper motor
Reference-class linear drive
Combines high precision, high forces, and high dynamics. High-performance and low-vibration 2-phase stepper motor with gear ratio allows precise positioning even without position sensor.
High-quality components
Ball screw for smooth feed. Nonrotating tip for uniform motion prevents wobble, torque, and wear at the point of contact. Incl. flat and spherical tip for decoupling forces. Noncontact limit switches protect the mechanics. A direction-sensing reference switch supports automation applications.
Reduced outgassing especially for use in vacuum environments
Most notably, for the lubrication of the guides and the drive screw a material with particularly low outgassing is used. This allows a bakeout temperature of up to 80° C. With this and other modifications of the PI V6 vacuum class, this positioner can be used up to 10-6hPa.
Application fields
Vacuum chambers. Research. Beamline instrumentation. Microscopy. Electronics assembly and inspection.
Specifications
Specifications
Motion | L-220.02A200V6 | Tolerance |
---|---|---|
Active axes | X | |
Travel range in X | 26 mm | |
Maximum velocity in X, unloaded | 0.8 mm/s | |
Positioning | L-220.02A200V6 | Tolerance |
Minimum incremental motion in X | 0.1 µm | typ. |
Unidirectional repeatability in X | ± 0.25 µm | typ. |
Bidirectional repeatability in X | 2 µm | typ. |
Reference switch | Hall effect, N/C contact, 5 V, NPN | |
Limit switches | Hall effect, N/C contact, 5 V, NPN | |
Drive Properties | L-220.02A200V6 | Tolerance |
Drive type | 2-phase stepper motor with gearhead | |
Nominal voltage | 3.5 V | |
Nominal current, RMS | 0.25 A | typ. |
Motor resolution | 24 Full steps/rev. | |
Drive force in positive direction of motion in X | 125 N | typ. |
Drive force in negative direction of motion in X | 125 N | typ. |
Resistance phase-phase | 12.5 Ω | typ. |
Inductance phase-phase | 6.3 mH | |
Back EMF, phase-phase, rotational | 11 V/kRPM | max. |
Mechanical Properties | L-220.02A200V6 | Tolerance |
Permissible push force in Y | 1 N | max. |
Holding force in X, passive | 125 N | |
Moved mass in X, unloaded | 20 g | |
Drive screw type | Ball screw | |
Drive screw pitch | 1 mm | |
Gear ratio i | 387283 : 5103 | |
Overall mass | 200 g | |
Material | Stainless steel, bronze | |
Miscellaneous | L-220.02A200V6 | Tolerance |
Operating temperature range | 5 to 40 °C | |
Vacuum class | 10⁻⁶ ǀ hPa | |
Connector | HD D-sub 26 (m) | |
Cable length | 0.15 m | |
Recommended controllers / drivers | C-663.12 C-885 with C-663.12C885 ACS modular controller |
Note on motor resolution: Resolution of the motor / drive unit: 1821
Note on cable length: Fixed cable (firmly attached to the product), vacuum side
At PI, technical data is specified at 22 ±3 °C. Unless otherwise stated, the values are for unloaded conditions. Some properties are interdependent. The designation "typ." indicates a statistical average for a property; it does not indicate a guaranteed value for every product supplied. During the final inspection of a product, only selected properties are analyzed, not all. Please note that some product characteristics may deteriorate with increasing operating time.
Downloads
Datasheet
Documentation
User Manual L220T0020
L-220.02A200V6 Precision linear actuator with stepper drive and gear for vacuum applications (1 E-6 hPa)
3D Models
3-D model L-220.02A200V6
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Technology
Vacuum
Careful handling, adequate premises: PI does not only have the necessary equipment for the qualification of materials, components and final products, but also has many years of experience with regard to HV und UHV positioning systems.
Piezo Actuators
Piezoelectric actuators offer subnanometer resolution and very short response times, making them ideally suitable for nanometer-precision positioning at high dynamics.
Applications
Beamline Instrumentation
Scientific experiments pose their own challenges, and beamline X-ray experiments are even more special in themselves. However, the need for precision equipment is universal.
Atomic Force Microscopy
Atomic force microscopy supplies researchers and developers extremely high resolution topographical data from a large number of different minerals, polymers, mixtures, composite materials or biological tissue. This technology, developed in the 1980s, enables users to obtain subatomic resolved images of sample surfaces.
Microscopy & Life Sciences
From genome research through the accurate diagnosis of illnesses to innovative solutions in surgery ‒ life sciences entail numerous disciplines in which new biomedical procedures are researched and devices are developed that are meant to improve the therapy for and quality of life of patients.
IsoView Light Sheet Microscope
Light Sheet Microscopy is a fascinating technology with a huge application potential in life sciences and biotechnology. IsoView is a brilliant interpretation of this technology, especially intended for imaging fast cellular dynamics across large specimens over several hours. Specimen positioning and objective translation plays a major role in the design of IsoView.
Flamingo Lightsheet Fluorescence Microscopy
Light Sheet Fluorescence Microscopy (LSFM), also called Single Plane Illumination Microscopy (SPIM ) is a very powerful microscopy technology for gentle in vivo imaging offering low phototoxicity and fast image acquisition.
GATTAscope (TIRFM)
Linear stages adjust the laser beam in the TIRF microscope. Precision positioning of the sample is possible by combining two XY stages.
Multi-Axis Beam Preparation
X-Ray Scanning Microscope
The Hard X-ray Micro/Nano-Probe beamline P06 at PETRA III provides advanced visualisation with micro/nanoscopic spatial resolution using different X-ray techniques.
Cryogenic Samples
The setup of the x-ray tomography stage, located at the P06 beamline of PETRA III at DESY (Germany) allows to investigate samples that require both cooling and vacuum environment.
Sample Adjustment
At Diamond Light Source, UK, beamline I07 is a high-resolution X-ray diffraction beamline dedicated to investigate the structure of surfaces and interfaces.
Slit Control
XZ positioning systems control x-xay slits at the the Shanghai Synchrotron Radiation Facility, Shanghai (SSRF).
Long-Term Positioning
High-Precision at 10-7 hPa, beamline experiments at the Swiss Light Source (SLS).
High Vacuum Positioning
Investigation of the structural properties of thin films under high-vacuum conditions.
Vacuum Chamber
Positioning the Vacuum Chamber for X-ray Diffraction Experiment
Sample Positioning in High-Vacuum
Sample Manipulators in High-Vacuum
Positioning for Laminography
High-Precision Spatial Positioning of Flat, Extended Objects
Tomography and Holography
Sample positioning setup inside tomography and holography endstations.
Optics Hutch Instrumentation
At DESY in Hamburg, the P05 Imaging Beamline is operated by the HZG.
Accelerator Technology
Dynamic compensation of Lorentz forces at the XFEL accelerator structures: The particle accelerator XFEL at the DESY (German Electron Synchrotron) uses acceleration technology based on super-conducting acceleration structures, so-called resonators or cavities.
Positioning of X-Ray Detectors
The LCLS produces synchrotron radiation of extremely high brilliance.
Nanotomography
At the X-ray light source PETRA III at the DESY research center in Hamburg operates the Imaging Beamline P05.
High-Speed Microscopy
For the first time ever, scientists from the Fraunhofer Institute for Production Technology IPT in Aachen have succeeded in achieving 100 percent microscopic testing in the industrial environment. The piezo-based PIFOC® drive system from PI was decisive for this success.
Confocal Microscopy
Confocal microscopy is used to detect the structure of the sample surface through the shifting of the focal plane, for example in dermatology.